4GHz Active Power Rail Probe
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- DC linearity: <0.1%
- Step response long-term aberrations: ±1%
- –40 to +85 °C (standard accessories)
- –40 to +155 °C (high temperature cable option)
- Offset setting error: ±2 mV max, ±0.4 μV typical
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Widely used in probing chipsets for power rail voltage supply and control in automotive, industrial and consumer markets, the active TPR1000 power rail probes are compatible with a wide range of oscilloscopes from Tektronix including, the 6 series MSO, 5 series MSO, MSO/DPO3000, MDO/DPO4000, MSO/DPO5000, DPO7000, and the DPO70000 oscilloscopes. Subsequently, this versatility is translated in its ability to probe digital power management, memory, ethernet connectivity, as well as probing noise sources on high-frequency power rails. Moreover, being a power-rail probe, this added functionality translates to a higher density, and faster switching speeds of modern electronic products that need lower supply voltages. This is makes it ideal for technicians who need to zoom-in on power rails whenever they are looking for high-frequency intruder signals, measure ripple, and analyze coupling effects with tighter tolerances. Another advantage with power-rail probes is that oscilloscopes often don't have enough offset to shift the noise and ripple on DC rails to the center of the screen to make the needed measurements. However, the probes can provide higher bandwidth to see more signal content (harmonics, faster ripples, etc.) on DC rails that could affect data signals, clocks, etc. Review of Key specifications The TPR1000 and TPR4000 probes provide a low noise as well as a large offset range solution for measurement of ripple on DC power rails ranging from –60 to +60 VDC. This is thanks to a DC coupling mode of DC to 1 GHz on the TPR1000, as well 4 GHz on the TPR4000. Secondly, the Tektronix’s power rail probes offer industry leading low noise and high offset range required to measure AC ripple between 200 μVp-p and 800 mVp-p at up to 4 GHz. Furthermore, the TPR1000 and TPR4000 probes provide a low-noise measurement solution whereby you end up reducing the noise of the oscilloscope and probe, as well as the noise and ripple of the DC supply being measured. Accordingly, the higher input impedance in the probes help minimize the oscilloscope loading effect on DC rails (50 kΩ at DC).
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