Powered by MegaZoom IV smart memory technology, the InfiniiVision 4000 X-Series not only lets you see more waveforms, but it also has the uncompromised ability to capture random and infrequent events that you would otherwise miss on an oscilloscope with a lower waveform update rate. In addition, this is made possible by the device’s ability to deliver waveform update rates that are 20 times faster than the competition, thus giving you more signal detail. Thus, when these qualities are aggregated, you are guaranteed of fast, responsive operations, rapid signal comparison in math functions, and rapid retrieval of measurements. Consequently, this implies that there is no slowdown with logic channels on and no slowdown with protocol decoding on.
With a huge memory depth, the segmented memory acquisition lets you selectively capture and store important signal activity. Indeed, this is accomplished without capturing unimportant signal idle time with the time stamp of each segment relative to the first trigger event. All this is made possible by an acquisition memory size of epic proportions, that can successfully capture 1,000 events in 3.27274 seconds, as well as the ability to easily capture infrequent events and anomalies. Review of Key specifications
The InfiniiVision 4000 X-Series redefines the oscilloscope experience with unprecedented integration. This 7-in-1 instrument provides: an oscilloscope with 16 digital channels (MSO), a serial protocol analyzer, a dual-channel WaveGen 20 MHz function, an arbitrary waveform generator, a 3-digit voltmeter, a frequency response analysis, as well as an 8-digit hardware counter with totalizer. Indeed, with an additional 16 integrated digital channels, you now have up to 20 channels of time-correlated triggering, acquisition and viewing on the same instrument. In fact, with its dual channels, you can generate differential signals to output arbitrary clock and data signals to simulate serial buses, create complex modulations.
As for the digital voltmeter, measurements are de-coupled from the oscilloscope triggering system so that both the voltmeter and triggered oscilloscope waveform capture can be made with the same connection.
Other enhanced reporting tools include, PC-based power analysis software package, which provides additional offline measurements and report generation. In fact, with the USB 2.0 signal quality test option (DSOX4USBSQ), designers of systems with USB interfaces can now perform automated signal quality testing. This option supports low-speed, full-speed, and hi-speed applications (hi-speed tests require 1.5 GHz models). The USB 2.0 signal quality test with HTML pass/ fail report generation includes eye-diagram mask testing, jitter analysis, EOP bit-width, signaling rate, edge monotonicity, and rise/fall times; all based on official USB-IF algorithms embedded in the oscilloscope.
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