The CT4121 active FET probe is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design. The CT4121 can measure up to ±40 V (DC + AC peak). Compatible with oscilloscopes from all major manufacturers, the probe is powered by the included 9 V battery or direct from the oscilloscope using the included USB power lead.
Furthermore, all specifications apply to the unit after a temperature stabilization time of 20 minutes over an ambient temperature range of 25 °C ± 5 °C. As a testament to its high resistance to thermal shocks is an operating Temp/humidity of -10°C to 40°C / Up to 85% RH. As for the altitude, the device has an operating altitude of 3,000 m and a nonoperating altitude of 15,300 m. Review of Key specifications
With a nascent need to have a real time and early identification of deviations and defects on circuits, probe manufacturers are responding by increasing digital speed while providing lowest noise and jitter. The CT4121 active FET probe accomplishes this through a rise time of 291 ps, an attenuation ratio of 10x, an accuracy of ±2%, as well as an adjustable output offset range of ±28 mV. With such features, technicians can comfortably prevent generation of inaccuracies which might adversely affect data acquisition, input dynamic range, waveform analysis, source impedance and input impedance, as well as frequency data. All in all, the CT4121 active FET probe has been optimally designed to meet evolving technical needs from multiuser research facilities. Therefore it has successfully combined highly sophisticated analytical options with extreme ease of use.
You have selected the maximum number of devices allowable for comparison